Call for Papers: International Conference on Embedded and VLSI Design 2018 -------------------------------------------------------------------------
The 31st International Conference on VLSI Design The 17th International Conference on Embedded Systems January 6-11, 2018, Pune, India http://embeddedandvlsidesignconference.org
This joint conference is a forum for researchers and designers to present and discuss current topics in VLSI design, electronic design automation, embedded systems, and emerging technologies. Two days of tutorials will be followed by three days of regular paper sessions, special sessions, and embedded tutorials. Industry presentation sessions along with exhibits, panel discussions, Design Contest, and Education Forum round off the program. The conference is followed by the Reliability Aware System Design and Test (RASDAT) workshop.
TOPICS OF INTEREST: Papers are invited on previously unpublished results in the following categories:
******************************** EMBEDDED SYSTEMS DESIGN
E1: Embedded Systems Hardware: HW/SW co-design, SoC, multi-core systems, board level hardware, HW security, Internet-of-Things (IoT) devices, sensors/actuators, displays
E2: Embedded Systems Software: Operating systems, firmware, algorithms, middleware, runtimes, parallelization, virtualization, software for low power, security, reliability, real-time support, emerging applications (e.g., automotive, telematics, analytics)
E3: FPGA and Reconfigurable Systems: FPGA architecture and FPGA circuit design, CAD for FPGA, FPGA prototyping, FPGA-based accelerators
E4: Wireless Systems: Sensor networks, low-power wireless systems, wireless protocols, wireless power delivery
E5: Embedded Case Studies: Practical and industrial tools, methodologies, designs in various application areas: wireless, medical, networking, multimedia, automotive, controls, etc.
DESIGN TOOLS AND EDA
T1: Design Verification: Functional, formal, coverage-driven, hardware-assisted, and assertion-based verification, behavioral, RTL, and gate-level simulation, emulation, equivalence checking
T2: Test, Reliability, Fault-Tolerance: DFT, fault modelling and simulation, ATPG, BIST, repair, delay test, fault tolerance, online test, AIMS/RF test, board-level and system-level test, silicon debug, post-silicon validation, memory test, reliability testing
T3: Computer-Aided Design (CAD): Logic and behavioral synthesis, logic mapping, simulation and formal verification, layout (partitioning, placement, routing, floor planning, and compaction), post route optimizations
DESIGN METHODOLOGIES AND TECHNOLOGY
M1: System-level Design: Methodologies and architectures, processor and memory design, multi-core, GPU design, networks-on-chip, defect-tolerant architectures, accelerators, distributed systems (e.g., automotive), cyber-physical systems
M2: Advances in Digital Design: Logic and physical synthesis, place and route, clock tree design, timing and signal integrity, design for manufacturability and yield, power integrity, variation-tolerant design
M3: Analog, Mixed-Signal, and RF Design: Design of analog, mixed signal, and RF IP, high-speed wired and wireless interfaces, low-power analog and RF
M4: Power-Aware Design: Power analysis and estimation, optimization and low-power design, energy-efficient design, battery-aware design, thermal management, energy harvesting
M5: CMOS Technology and Devices: Deep nanoscale CMOS devices, device modelling and simulation, multi-domain simulation, device/circuit-level reliability and variability
M6: Emerging Technologies: Post-CMOS devices, MEMS sensors, biomedical circuits, lab-on-chip, carbon nanotubes, silicon photonics, spintronic, memristors, neuromorphic and quantum computing
SAFE AND SECURE INTELLIGENT SYSTEMS S1: Design for Safety and Reliability Physically unclonable functions, random number generators, fault tolerance systems and architectures
S2: Secure Circuits and Systems System security, side channel attacks and anti-piracy methodologies, Embedded systems security in healthcare, automotive, industrial and IoT applications
S3: Safety Assurance of Circuits/ Systems Design for functional safety and certifications in airborne, health care, automotive systems
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EMBEDDED TUTORIALS AND SPECIAL SESSIONS: Proposals in relevant emerging areas should be submitted as two-page abstracts. On acceptance, authors are required to submit full regular papers.
HALF-DAY AND FULL-DAY TUTORIALS: Tutorial proposal are invited for topics of interest including VLSI design, EDA, VLSI technology, and embedded systems. The tutorials will be arranged on the first two days of the conference.
PANELS: Proposals must be submitted with an abstract, and a list of panelists.
SUBMISSIONS: All submissions should be made electronically via the conference website by July 16, 2017. Your manuscript should clearly state the novel ideas, results, and applications of the contribution. Paper submissions will undergo a double-blind review. Papers must be in PDF format and not exceed 6 single-spaced pages including figures and references in two-column IEEE conference paper format. Papers exceeding the page limit or identifying the authors will be rejected without review.
EXHIBITS: Please contact the Exhibits Chair to explore opportunities to display your products/services.
FELLOWSHIPS: The conference will award fellowships, based on need and merit, to partially cover expenses of attendees from India. Application details will be posted at the conference website.
DESIGN CONTEST: Please check the conference website or contact the Design Contest Chair for more details.
USER TRACK AND PHD FORUM: Please check the conference website for details on criteria and submission dates.
IMPORTANT DATES: Submission of Full paper deadline: July 16, 2017 Acceptance notification: September 17, 2017 Camera ready paper due: October 8, 2017